Measurement of microthermal deformations in an optical pick-up base using holographic interferometry

Yongmin Seo; Sunghoon Cho; Shinill Kang

doi:10.1117/1.1613277

1 November 2003 Measurement of microthermal deformations in an optical pick-up base using holographic interferometry

Yongmin Seo, Sunghoon Cho, Shinill Kang

Optical Engineering, Vol. 42, Issue 11, (November 2003). https://doi.org/10.1117/1.1613277

An experimental method is presented to measure microthermal deformation of an optical pick-up base by using holographic interferometry. Calibration tests are used to measure out-of-plane and in-plane deformations. A cantilever and a plate are deformed according to the prescribed motion, actuated by a piezoelectric transducer with 1-nm resolution, and the interferometric measurements are compared quantitatively with the analytic solution and measurements from finite element analysis (FEA). The thermal deformation of an aluminum pick-up base, manufactured from a die-casting process, are measured in actual thermal environments by using the present holographic interferometry. Finally, the experimental results obtained by using holographic interferometry are compared with those of the FEA with initial surface stress conditions obtained from x-ray diffraction measurements.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Yongmin Seo, Sunghoon Cho, and Shinill Kang "Measurement of microthermal deformations in an optical pick-up base using holographic interferometry," Optical Engineering 42(11), (1 November 2003). https://doi.org/10.1117/1.1613277

Published: 1 November 2003

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