Low-frequency in-plane vibration monitoring/measurement using circular grating Talbot interferometer

Shilpi Agarwal; Chandra Shakher

doi:10.1117/1.OE.57.5.054112

23 May 2018 Low-frequency in-plane vibration monitoring/measurement using circular grating Talbot interferometer

Shilpi Agarwal, Chandra Shakher

Author Affiliations +

Optical Engineering, Vol. 57, Issue 5, 054112 (May 2018). https://doi.org/10.1117/1.OE.57.5.054112

Abstract

An application of circular grating Talbot interferometer for measurement of low-frequency vibrations in a plate is demonstrated. Experiments were conducted to measure/monitor the in-plane low-frequency vibration from 1 to 25 Hz in a plate object. The measurement system is advantageous over accelerometer, because it is easy to construct, less expensive, and robust. This method can be implemented conveniently to quantitatively measure temporal and continual displacements of the vibration object with variable sensitivity and also applicable to shallow curved objects.

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Shilpi Agarwal and Chandra Shakher "Low-frequency in-plane vibration monitoring/measurement using circular grating Talbot interferometer," Optical Engineering 57(5), 054112 (23 May 2018). https://doi.org/10.1117/1.OE.57.5.054112

Received: 15 December 2017; Accepted: 7 May 2018; Published: 23 May 2018

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