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The method of ellipsometric tomography designed for precision measurements of complex refractive index variations in the volume of thin surface layers is considered. It is shown, that multi-wavelength ellipsometric measurements of light, reflected and scattered by the surface layer, allowed us to reconstruct its internal structure by solving a first order integral equation.
Vladmir A. Kotenev
"Ellipsometric tomography", Proc. SPIE 1843, Analytical Methods for Optical Tomography, (3 November 1992); https://doi.org/10.1117/12.131899
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Vladmir A. Kotenev, "Ellipsometric tomography," Proc. SPIE 1843, Analytical Methods for Optical Tomography, (3 November 1992); https://doi.org/10.1117/12.131899