Abstract
A model is proposed for the diffusive smearing of interfaces of different geometries in metal nanoglasses. It is shown that the smearing of planar interfaces occurs faster than that of triple junctions, which, in turn, takes place faster than that of the nodes. This accounts for the variation of the mean positron lifetime in metal nanoglasses induced by thermal treatment.
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Fiz. Tverd. Tela (St. Petersburg) 41, 1627–1629 (September 1999)
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Kolesnikova, A.L., Ovid’ko, I.A. & Romanov, A.E. Transformation of interfaces in nanoamorphous solids. Phys. Solid State 41, 1491–1493 (1999). https://doi.org/10.1134/1.1131038
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DOI: https://doi.org/10.1134/1.1131038