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Determination of elastic moduli of GaN epitaxial layers by microindentation technique

  • Semiconductors and Dielectrics
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Abstract

It is demonstrated that Young’s modulus of epitaxial gallium nitride layers can be determined by the microindentation of their growth surface. The technique is based on the solution of the Hertz problem for the elastic indentation of a steel sphere into the studied surface. It is established that the isotropic approximation applied in this case is justified and leads to the satisfactory results. The microhardness measurements of epitaxial layers are carried out.

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References

  1. H. A. Amano, M. Kito, K. Hiramatsu, et al., Jpn. J. Appl. Phys. 28, L2112 (1989).

    Google Scholar 

  2. S. Nakamura, M. Senoh, and T. Mukai, Jpn. J. Appl. Phys. 32, Part 2 (1A/B), L8 (1993).

    Google Scholar 

  3. V. A. Ivantsov, V. A. Sukhoveev, V. I. Nikolaev, et al., Fiz. Tverd. Tela (S.-Peterburg) 39, 858 (1997).

    Google Scholar 

  4. E. S. Hellman, C. D. Brandle, L. F. Schneemeyer, et al., MRS Internet J. Nitride Semicond. Res. 1, 1 (1996) (http://nsr.mij.mrs.org/1/1/).

    Google Scholar 

  5. Yu. Melnik, A. Nikolaev, I. Nikitina, et al., Mater. Res. Soc. Symp. Proc. 482, 269 (1998).

    Google Scholar 

  6. V. A. Savastenko and A. U. Sheleg, Phys. Status Solidi A 48, K135 (1978); A. U. Sheleg and V. A. Savastenko, Izv. Akad. Nauk SSSR, Neorg. Mater. 15, 1257 (1979).

    Google Scholar 

  7. A. Polian, M. Grimsditch, and I. Grzegory, J. Appl. Phys. 79, 3343 (1996).

    Article  ADS  Google Scholar 

  8. R. B. Schwarz, K. Khachaturyan, and E. R. Weber, Appl. Phys. Lett. 70, 1122 (1997).

    Article  ADS  Google Scholar 

  9. Y. Takagi, M. Ahart, T. Azuhata, et al., Physica B (Amsterdam) 218–220, 547 (1996).

    Google Scholar 

  10. K. Kim, R. L. Lambrecht, and B. Segall, Phys. Rev. B: Condens. Matter 50, 1502 (1994); Phys. Rev. B: Condens. Matter 53, 16 310 (1996).

    ADS  Google Scholar 

  11. A. F. Wright, J. Appl. Phys. 82, 2833 (1997).

    ADS  Google Scholar 

  12. V. F. Berdikov, A. V. Babanin, and Yu. A. Artem’eva, Zavod. Lab., No. 8, 1014 (1975).

  13. M. Leszczynski, T. Suski, H. Teisseyre, et al., J. Appl. Phys. 76, 4909 (1994).

    Article  ADS  Google Scholar 

  14. J. F. Nye, Physical Properties of Crystals, Their Representation by Tensors and Matrices (Clarendon, Oxford, 1957; Inostrannaya Literatura, Moscow, 1960).

    Google Scholar 

  15. T. D. Shermergor, Elasticity Theory of Microinhomogeneous Matter (Nauka, Moscow, 1977).

    Google Scholar 

  16. R. Hill, Proc. Phys. Soc. A 65(389), 349 (1952).

    ADS  Google Scholar 

  17. Physical Properties of Steels and Alloys Employed in Power Engineering, Ed. by B. E. Neimark (Énergiya, Moscow, 1967).

    Google Scholar 

  18. V. S. Nikishin and G. S. Shapiro, Problems of Elasticity Theory for Multilayer Materials (Nauka, Moscow, 1973).

    Google Scholar 

  19. V. I. Nikolaev, V. V. Shpeizman, and B. I. Smirnov, in Proceedings of Second All-Russia Conference “Gallium, Aluminum, and Indium Nitrides: Structure and Instruments,” St. Petersburg, Russia, 1998 (SPbGTU, St. Petersburg, 1998), p. 32.

    Google Scholar 

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Translated from Fizika Tverdogo Tela, Vol. 42, No. 3, 2000, pp. 428–431.

Original Russian Text Copyright © 2000 by Nikolaev, Shpe\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\)zman, Smirnov.

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Nikolaev, V.I., Shpeizman, V.V. & Smirnov, B.I. Determination of elastic moduli of GaN epitaxial layers by microindentation technique. Phys. Solid State 42, 437–440 (2000). https://doi.org/10.1134/1.1131227

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