Abstract
A new algorithm for determining the optical parameters of deposited multilayer optical coatings based on comparing the positions of the extrema of the optical characteristics of multilayer optical coatings is proposed. Two versions of this algorithm are compared. Using a series of numerical simulation experiments, the advantage of one of these versions is demonstrated. It is shown that this version decreases the influence of systematic errors in the spectral data.
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References
A. V. Tikhonravov and M. K. Trubetskov, “Modern design tools and a new paradigm in optical coating design,” Appl. Opt. 51, 7319–7332 (2012).
A. V. Tikhonravov, “On a method of synthesis of optical coatings using optimality conditions,” Vestn. Mosk. Univ., Ser. Fiz.-Astron. 23 (6), 91–93 (1982).
T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, “Comparison of algorithms used for optical characterization of multilayer optical coatings,” Appl. Opt. 50, 3389–3395 (2011).
A. V. Tikhonravov and M. K. Trubetskov, “On-line characterization and re-optimization of optical coatings,” Proc. SPIE 5250, 406–413 (2003).
S. Wilbrandt, O. Stenzel, X. Kaixer, M. K. Trubetskov, and A. V. Tikhonravov, “In situ optical characterization and reengineering of interference coatings,” Appl. Opt. 47, 49–54 (2008).
A. V. Tikhonravov and A. Gorokh, “Modified sequential algorithm for the on-line characterization of optical coatings,” Opt. Express 23, 23561–23569 (2015).
A. Tikhonravov, M. Trubetskov, and G. DeBell, “On the accuracy of optical thin film parameter determination based on spectrophotometric data,” Proc. SPIE 5188, 190–199 (2003).
A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, E. Quesnel, A. Duparre, D. Ritstau, and S. Gunster, “Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films,” Appl. Opt. 41, 2555–2560 (2002).
A. V. Tikhonravov, V. G. Zhupanov, V. X. Fedoseev, and M. K. Trubetskov, “Design and production of antireflection coating for the 8-10 µm spectral region,” Opt. Express 22, 32174–32179 (2014).
Sh. A. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Atlantica Séguier Frontières, Gifsur-Yvette, France, 1992).
V. A. Morozov, “Regularization of incorrectly posed problems and the choice of regularization parameter,” USSR Comput. Math. Math. Phys. 6 (1), 242–251 (1966).
A. N. Tikhonov, A. V. Goncharskii, V. V. Stepanov, and A. G. Yagola, Numerical Methods for the Solution of Ill-Posed Problems (Kluwer, Berlin, 1995).
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Original Russian Text © T.F. Isaev, D.V. Lukyanenko, A.V. Tikhonravov, A.G. Yagola, 2017, published in Zhurnal Vychislitel’noi Matematiki i Matematicheskoi Fiziki, 2017, Vol. 57, No. 5, pp. 867–875.
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Isaev, T.F., Lukyanenko, D.V., Tikhonravov, A.V. et al. Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics. Comput. Math. and Math. Phys. 57, 867–875 (2017). https://doi.org/10.1134/S0965542517050025
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DOI: https://doi.org/10.1134/S0965542517050025