Abstract
Different procedures for analysis of particle sizes by the X-ray diffraction method are compared by the example of nanoparticles of nickel and iron(3+) oxide (Fe2O3). A modified Warren-Averbach method is proposed for the analysis of the X-ray diffraction line profile based on the approximation by the Voigt function, which yields stable solutions, and the efficiency of the method is shown. The analysis within the frame-work of the Warren-Averbach method makes it possible to restore the distribution function of nanoparticles (crystallites) over true diameters, which satisfactorily correlates with electron microscopy data. The applicability of the Warren-Averbach method to the estimation of crystallite sizes by the analysis of a single diffraction line is substantiated. The range of the applicability of the Scherrer, Williamson-Hall, Warren-Averbach, and modified Warren-Averbach methods to the substructure analysis by the X-ray diffraction is determined as depending on the method of nanostructure formation.
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Original Russian Text © G.A. Dorofeev, A.N. Streletskii, I.V. Povstugar, A.V. Protasov, E.P. Elsukov, 2012, published in Kolloidnyi Zhurnal, 2012, Vol. 74, No. 6, pp. 710–720.
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Dorofeev, G.A., Streletskii, A.N., Povstugar, I.V. et al. Determination of nanoparticle sizes by X-ray diffraction. Colloid J 74, 675–685 (2012). https://doi.org/10.1134/S1061933X12060051
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DOI: https://doi.org/10.1134/S1061933X12060051