Abstract
In this work, ZnO and boron doped ZnO (ZnO:B) thin films were produced by chemical spray pyrolysis method. ZnO and ZnO:B films were obtained onto glass substrates at 450°C by spray pyrolysis method and the physical properties of those films were examined by X-ray diffraction (XRD), scanning electron microscopy (SEM), ultraviolet-visible spectrometer (UV) and four probe technique. XRD measurements show that all films have hexagonal wurtzite structure and all films grow preferentially along (002) direction. Morphologies of the films were examined by using a scanning electron microscopy and it was observed that almost all films were quite intense with a regular structure. Optical measurements showed that the band gap energies of the films increased with boron concentrations. The resistances of the B-doped ZnO films were measured by four probe method and resistances of films initially decreased to its minimum 1 at% boron doping and then it increased again with increasing B concentration. It was also observed that that boron doping increased the activation energies of the films.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano, and H. Hosono, Science 300, 1269 (2003).
T. Nakada, Y. Hirabayashi, T. Tokado, D. Ohmori, and T. Mise, Sol. Energy 77, 739 (2004).
S. Y. Lee, E. S. Shim, H. S. Kang, S. S. Pang, and J. S. Kang, Thin Solid Films 437, 31 (2005).
R. Könenkamp, R. C. Word, and C. Schlegel, Appl. Phys. Lett. 85, 6004 (2004).
S. T. Mckinstry, and P. Muralt, J. Electroceram. 12, 7 (2004).
Z. L. Wang, X. Y. Kong, Y. Ding, P. Gao, W. L. Hughes, R. Yang, and Y. Zhang, Adv. Funct. Mater. 14, 943 (2004).
M. S. Wagh, L. A. Patil, T. Seth, and D. P. Amalnerkar, Mater. Chem. Phys. 84, 228 (2004).
Y. Ushio, M. Miyayama, and H. Yanagida, Sensor Actuat. B 17, 221 (1994).
H. Harima, J. Phys.: Condens. Matter 16, S5653 (2004).
S. J. Pearton, W. H. Heo, M. Ivill, D. P. Norton, and T. Steiner, Semicond. Sci. Technol. 19, R59 (2004).
I. Kim, K.-S. Lee, T. Seong Lee, J.-h. Jeong, B.-ki Cheong, Y.-J. Baik, and W. M. Kim, J. Appl. Phys. 100, 063701 (2006)
S. Kerli, U. Alver, A. Tanriverdi, and B. Avar, Protection Met. Phys. Chem. Surf. 50 (6), 3 (2014).
S. Ilican, F. Yakuphanoglu, M. Caglar, and Y. Caglar, J. Alloys Compd. 509 (17), 3 (2011).
Zh. Zhang, Ch. Bao, W. Yao, Sh. Ma, L. Zhang, and Sh. Hou, Superlattices Microstruct. 49 (6), 3 (2011).
Y.-S. Kim and W.-P. Tai, Appl. Surf. Sci. 253 (11), 3 (2007).
H. Nian, S. H. Hahn, K.-K. Kooc, E. W. Shina, and E. J. Kima, Mater. Lett. 63 (26), 3 (2009).
B. N. Pawar, S. R. Jadkar, and M. G. Takwale, J. Phys. Chem. Solids 66, 1779 (2005).
B. J. Lokhande, P. S. Patil, and M. D. Uplane, Physica B 302–303, 59 (2001).
M. Krunks, T. Dedova, and I. Oja Açik, Thin Solid Films 515, 1157 (2006).
M. Caglar, S. Ilican, Y. Caglar, and F. Yakuphanoglu, J. Alloys Compd. 509 (6), 3 (2011).
E. Fathi, Y. Vygranenko, M. Vieira, and A. Sazonov, Appl. Surf. Sci. 257 (21), 3 (2011).
G. ho Kim, J. By analyzing, Y. Kim, S. K. Rout, and S. Ihl Woo, Appl Phys A 97, 821 (2009).
P. M. Ratheesh Kumar, Doctoral Dissertation (Cochin University of Science and Technology, Cochin, India, 2007), p. 248.
A. V. Patil, C. G. Dighavkar, S. K. Sonawane, S. J. Patil, and R. Y. Borse, J. Optoelectron. Biomed. Mater. 1 (2), 3 (2009).
R. Kumar and N. Khare, Thin Solid films, 516, 1302 (2008).
Author information
Authors and Affiliations
Corresponding authors
Additional information
The article is published in the original.
Rights and permissions
About this article
Cite this article
Kerli, S., Alver, U., Tanriverdi, A. et al. Structural and physical properties of boron doped ZnO films prepared by chemical spray pyrolysis method. Crystallogr. Rep. 60, 946–950 (2015). https://doi.org/10.1134/S1063774515060139
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063774515060139