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Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys

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Abstract

The VST3331 titanium alloy in three structural states with different dispersities of the secondary α phase of titanium has been investigated by scanning electron microscopy and X-ray diffraction analysis. The possibility of using full-profile analysis of X-ray diffraction patterns for determining the size of titanium secondary α-phase crystallites has been estimated. It is demonstrated that the methods in use yield similar estimates of the average thickness of titanium secondary α-phase plates.

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Authors and Affiliations

  1. PSC VSMPO-AVISMA Corporation, 624760, Verkhnyaya Salda, Sverdlovsk region, Russia

    M. S. Kalienko, A. V. Volkov & A. V. Zhelnina

  2. Ural Federal University, 620002, Ekaterinburg, Russia

    M. S. Kalienko

Authors
  1. M. S. Kalienko
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  2. A. V. Volkov
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  3. A. V. Zhelnina
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Correspondence to M. S. Kalienko.

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Translated by E. Bondareva

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Kalienko, M.S., Volkov, A.V. & Zhelnina, A.V. Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys. Crystallogr. Rep. 65, 412–416 (2020). https://doi.org/10.1134/S1063774520020121

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  • DOI: https://doi.org/10.1134/S1063774520020121

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