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Structural parameters of synthetic opals: Statistical analysis of electron microscopy images

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Abstract

The paper reports on a comprehensive study of the statistical characteristics of an ensemble of a-SiO2 particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of a-SiO2 particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments.

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Authors and Affiliations

  1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 29, St. Petersburg, 194021, Russia

    K. B. Samusev, M. V. Rybin & M. F. Limonov

  2. School of Materials Science and Engineering, Georgia Institute of Technology, GA 30332-0245, Atlanta, USA

    G. N. Yushin

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  1. K. B. Samusev
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  2. G. N. Yushin
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  3. M. V. Rybin
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  4. M. F. Limonov
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Correspondence to M. V. Rybin.

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Original Russian Text © K.B. Samusev, G.N. Yushin, M.V. Rybin, M.F. Limonov, 2008, published in Fizika Tverdogo Tela, 2008, Vol. 50, No. 7, pp. 1230–1236.

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Samusev, K.B., Yushin, G.N., Rybin, M.V. et al. Structural parameters of synthetic opals: Statistical analysis of electron microscopy images. Phys. Solid State 50, 1280–1286 (2008). https://doi.org/10.1134/S1063783408070147

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  • DOI: https://doi.org/10.1134/S1063783408070147

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