Abstract
A method for measuring photoreflectance (PR) by using a Fourier transform infrared (FTIR) spectrometer has been implemented. Features of application of the phase-correction method necessary for storing information on the sign of the spectrum were revealed. The method was applied for measuring the energy spectrum of charge carriers in In x Ga1 − x As/GaAs single quantum wells in the near-infrared range. A good agreement with the results obtained by means of a diffraction spectrometer for the same samples in the same wavelength range is observed. Application of the developed photomodulation FTIR spectroscopy method for measuring photoreflectance in InSb epitaxial layers in the wavelength range of 2–10 μm has been demonstrated.
Similar content being viewed by others
Rererences
T. J. C. Hosea, M. Merrick, and B. N. Murdin, Phys. Status Solidi (a) 202(7), 1233–1243 (2005).
Jun Shao, Wei Lu, Fangyu Yue, Xiang Lu, Wei Huang, Zhifeng Li, Shaoling Guo, and Junhao Chu, Rev. Sci. Instrum. 78(1), 01311 (2007).
M. Motyka, G. Sek, J. Misiewicz, A. Bauer, M. Dallner, and S. Hofling, Appl. Phys. Express 2, 126505 (2009).
Jun Shao, Lu Chen, Xiang Lu, Wei Lu, Li He, Shaoling Guo, and Junhao Chu, Appl. Phys. Lett. 95(1), 041908 (2009).
P. R. Griffiths and J. A. De Haseth, Fourier Transform Infrared Spectrometry (Wiley & Sons, Hoboken, New Jersey, 2007).
R. J. Bell, Introductory Fourier Transform Spectroscopy (Academic, New York, 1972).
A. N. Pikhtin, O. S. Komkov, and F. Bugge, Phys. Status Solidi (a) 202(7), 1270 (2005).
O. S. Komkov, A. N. Pikhtin, and Yu. V. Zhilyaev, Izv. Vyssh. Uchebn. Zaved., Mater. Elektr. Tekhn. 53(1), 45 (2011) [Russ. Microelectron. 41 (8), 508 (2012)].
A. N. Pikhtin, O. S. Komkov, and K. V. Bazarov, Semiconductors 40(5), 592 (2006).
J. Gronholz and W. Herres, Instrum. Comput. 3, 10–16 (1985).
L. Mertz, Transformation in Optics (John Wiley and Sons, New York, 1965).
M. L. Forman, W. H. Steel, and G. A. Vanasee, J. Opt. Soc. Am. 56(1), 59 (1966).
S. M. Hutson and M. S. Braiman, Appl. Spectrosc. 52(7), 974–984 (1998).
T. J. C. Hosea, Phys. Status Solidi (b) 189(2), 531–542 (1995).
C. L. Littler and D. G. Seller, Appl. Phys. Lett. 46(1), 986–988 (1985).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © D.D. Firsov, O.S. Komkov, 2013, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2013, Vol. 39, No. 23, pp. 87–94.
Rights and permissions
About this article
Cite this article
Firsov, D.D., Komkov, O.S. Photomodulation fourier transform infrared spectroscopy of semiconductor structures: Features of phase correction and application of method. Tech. Phys. Lett. 39, 1071–1073 (2013). https://doi.org/10.1134/S1063785013120079
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063785013120079