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Effect of low-frequency noise on the threshold sensitivity of middle-IR photodetectors in a broad frequency range

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Abstract

Low-frequency noise of a photodiode-based photodetector (PD) implementing a transimpedance amplifier scheme has been analyzed. It is found that the low-frequency (drift) noise component in the input chains of modern operational amplifiers makes a decisive contribution to resultant noises of PDs based on A3B5 photodiodes at frequencies up to several hundred kilohertz. An illustrative “vector” method of description of the noise characteristics of PD elements is proposed for selecting the optimum type of operational amplifier so as to achieve the final sensitivity and accuracy characteristics at a given response speed.

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Authors and Affiliations

  1. Ioffe Physical Technical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    S. E. Aleksandrov, G. A. Gavrilov & G. Yu. Sotnikova

  2. St. Petersburg State Polytechnical University, St. Petersburg, 195251, Russia

    S. E. Aleksandrov, G. A. Gavrilov & G. Yu. Sotnikova

Authors
  1. S. E. Aleksandrov
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  2. G. A. Gavrilov
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  3. G. Yu. Sotnikova
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Corresponding author

Correspondence to G. Yu. Sotnikova.

Additional information

Original Russian Text © S.E. Aleksandrov, G.A. Gavrilov, G.Yu. Sotnikova, 2014, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2014, Vol. 40, No. 16, pp. 58–64.

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Aleksandrov, S.E., Gavrilov, G.A. & Sotnikova, G.Y. Effect of low-frequency noise on the threshold sensitivity of middle-IR photodetectors in a broad frequency range. Tech. Phys. Lett. 40, 704–707 (2014). https://doi.org/10.1134/S1063785014080161

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  • DOI: https://doi.org/10.1134/S1063785014080161

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