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A study of the effect of residual stress on magnetic properties of Fe-Ni thin film using a synchrotron X-ray

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Abstract

Fe20Ni80 thin films, with a thickness of 0.7 μm, were sputtered onto Si (111) single crystal and 40-μm thick Ni79Fe21 ribbons were fabricated using the rapid solidification process (RSP). Annealing of Ni-Fe thin films and ribbons at various temperatures showed that the stress induced during the sample fabrication was relieved with a subsequent decrease in coercivity, which was determined from the measurements of magnetic properties using a vibrating sample magnetometer (VSM). Decrease in coercivity of Ni-Fe thin films and ribbons were strongly dependent on annealing temperatures. Also noted was a high correlation between residual stress reduction at different annealing temperatures and coercivity that magnetic properties are strongly influenced by residual stress induced in samples.

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Authors and Affiliations

  1. Research Institute of Industrial Science & Technology, Pohang, Kyungbuk, 790-330, Republic of Korea

    C. W. Kim & K. H. Cho

  2. Department of Mat. Eng., Kangwon National University, Samcheok, Gangwondo, 245-711, Republic of Korea

    H. G. Suk

Authors
  1. C. W. Kim
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  2. K. H. Cho
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  3. H. G. Suk
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Correspondence to H. G. Suk.

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Kim, C.W., Cho, K.H. & Suk, H.G. A study of the effect of residual stress on magnetic properties of Fe-Ni thin film using a synchrotron X-ray. Phys. Metals Metallogr. 115, 1338–1341 (2014). https://doi.org/10.1134/S0031918X14130092

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  • DOI: https://doi.org/10.1134/S0031918X14130092

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