Dependence on Annealing Temperature of Properties of Cu2ZnSnS4 Thin Films Prepared by Sol–Gel Sulfurization Method

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Published 20 January 2011 Copyright (c) 2011 The Japan Society of Applied Physics
, , Citation Kazuya Maeda et al 2011 Jpn. J. Appl. Phys. 50 01BE10 DOI 10.1143/JJAP.50.01BE10

1347-4065/50/1S2/01BE10

Abstract

Cu2ZnSnS4 (CZTS) thin films were fabricated using a rapid thermal process in 5% H2S+ N2 atmosphere from precursors prepared by the sol–gel method. The precursors were preheated at 250 °C for 10 min and then sulfurized at different temperatures from 300 to 600 °C for 10 min. XRD studies showed that the samples sulfurized at 500–600 °C had a CZTS structure. With increasing sulfurization temperature, the chemical composition ratio of sulfur/metal and the grains size of CZTS increased. From the (αh ν)2hν plot, the CZTS films had a band gap of ∼1.5 eV.

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10.1143/JJAP.50.01BE10