Low Temperature Dependence of Oscillation Wavelength in GaAs1-xBix Laser by Photo-Pumping

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Published 4 June 2010 ©2010 The Japan Society of Applied Physics
, , Citation Yoriko Tominaga et al 2010 Appl. Phys. Express 3 062201 DOI 10.1143/APEX.3.062201

1882-0786/3/6/062201

Abstract

Lasing oscillation from a GaAs1-xBix/GaAs semiconductor chip with a Fabry–Perot cavity is acheived for the first time by photo-pumping. The GaAs0.975Bi0.025 active layer was grown at a very low temperature of 350 °C by molecular beam epitaxy. The characteristic temperature of the laser was 83 K between 150 and 240 K. The lasing emission peak energy decreased at a constant rate of -0.18 meV/K, which is only 40% of the temperature coefficient of the GaAs band gap in this temperature range. Above 240 K, the lasing threshold pumping power increased sharply, and the lasing emission peak energy started shifting to a shorter wavelength.

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