Some Applications of an Ultra-High Voltage Electron Microscope on Materials Science

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Copyright (c) 1972 The Japan Society of Applied Physics
, , Citation Hiroshi Fujita et al 1972 Jpn. J. Appl. Phys. 11 1522 DOI 10.1143/JJAP.11.1522

1347-4065/11/10/1522

Abstract

Fundamental problems for application of a 3 MV-class electron microscope have been examined at 2 MV on various materials such as aluminum, copper, 18-8 type stainless steel and gold as follows: (a) The maximum observable thickness of these specimens at 2 MV is generally 12∼13 times larger than those at 0.1 MV. And thus, it is expected that processes of various phenomena in most materials can be continuously observed as same as in bulk specimens by the electron microscopy. (b) The anomalous transmission of electrons clearly occurs at the symmetry position of 111 reflections at 2 MV even in aluminum. (c) Total amount of secondary defects due to electron irradiation damage strongly depends not only on the order of reflections but also on deviation from the Bragg condition. When the anomalous transmission at the symmetry position occurs, the amount of defects shows the maximum value at the symmetry position of reflections. (d) Utility of capsules are examined on determination of the liquid structure and oxidizing processes of aluminum.

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10.1143/JJAP.11.1522