Preparation and Dielectric Properties of SrTiO3/BaTiO3 Multilayer Thin Films by Sol-Gel Method

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Copyright (c) 1995 The Japan Society of Applied Physics
, , Citation Takashi Hayashi and Takashi Tanaka Takashi Tanaka 1995 Jpn. J. Appl. Phys. 34 5100 DOI 10.1143/JJAP.34.5100

1347-4065/34/9S/5100

Abstract

SrTiO3/BaTiO3 multilayer thin films were prepared at 650° C on Pt(111)/SiO2/Si(100) substrates by the dip-coating method using metal alkoxides. No formation of (Ba, Sr)TiO3 solid solution between BaTiO3 layers and SrTiO3 layers was detected in X-ray diffraction analysis. The SrTiO3/BaTiO3 multilayer thin films consisted of grain structure with grain size of about 30 nm. A film thickness of about 20 nm was obtained by one cycle of the dip-coating/heating process. The SrTiO3/BaTiO3 multilayer thin films with a thickness of 400 nm exhibited dielectric constants of about 400 and loss tangent of 0.03. By reheating the multilayer thin films at temperatures up to 1000° C, (Ba1-xSrx)TiO3 solid solution with the composition gradient between Ba and Sr was formed.

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