Evaluation of InGaP/InGaAs/Ge Triple-Junction Solar Cell under Concentrated Light by Simulation Program with Integrated Circuit Emphasis

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Published 10 March 2004 Copyright (c) 2004 The Japan Society of Applied Physics
, , Citation Kensuke Nishioka et al 2004 Jpn. J. Appl. Phys. 43 882 DOI 10.1143/JJAP.43.882

1347-4065/43/3R/882

Abstract

The characteristics of a multi-junction solar cell under concentrated light were evaluated by Simulation Program with Integrated Circuit Emphasis (SPICE). We developed the multi-unit model and analyzed the affects of the chromatic aberration and intensity distribution for the multi-junction cells. In the multi-unit model, the same numbers of units as grid numbers are installed for every electrode, and the units were connected to each other via lateral resistances. In order to obtain the generation current from each diode, we measured the intensity of concentrated light through the pinhole using single-junction solar cells consisting of InGaP, GaAs and Ge as detectors. By using the multi-unit model, we could successfully calculate the electrical cell performances taking the chromatic aberration and intensity distribution into account, and the calculated value agreed well with the experimental value. The multi-unit model will be very useful for cell designs and performance analysis of the concentrator cells.

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10.1143/JJAP.43.882