Characterization of Extremely Low Loss Dielectrics (Mg0.95Zn0.05)TiO3 at Microwave Frequency

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Published 10 January 2007 Copyright (c) 2007 The Japan Society of Applied Physics
, , Citation Cheng-Liang Huang and Shi-Sheng Liu 2007 Jpn. J. Appl. Phys. 46 283 DOI 10.1143/JJAP.46.283

1347-4065/46/1R/283

Abstract

The microwave dielectric properties and microstructures of (Mg0.95Zn0.05)TiO3 ceramics, prepared by a mixed oxide route, were investigated. The ceramics could be sintered at temperatures as low as 1250 °C and their microwave dielectric properties were found to be strongly correlated with sintering temperature. The quality factor (Q×f) of (Mg0.95Zn0.05)TiO3 increased with temperature up to 1300 °C and decreased thereafter. The decrease in Q×f was coincident with the observed abnormal grain growth. A maximum Q×f of 264000 GHz associated with an εr of 17.1 and a τf of -40.3 ppm/°C was achieved for the samples at 1300 °C/4 h. Thus, (Mg0.95Zn0.05)TiO3 is proposed as a very promising dielectric material for low-loss microwave applications.

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10.1143/JJAP.46.283