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Determination of Precursor Sites for Pitting Corrosion of Polycrystalline Titanium by Using Different Techniques

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© 1998 ECS - The Electrochemical Society
, , Citation L. F. Garfias‐Mesias et al 1998 J. Electrochem. Soc. 145 2005 DOI 10.1149/1.1838590

1945-7111/145/6/2005

Abstract

Scanning electrochemical microscopy (SECM) in ferrocyanide and bromide solutions was used to locate active sites (pitting precursors) on polycrystalline Ti where oxidation of and was possible. Analysis of the electroctro‐chemically active sites was done by using electron microscopy (SEM), energy dispersive X‐ray analysis (EDX), atomic force microscopy (AFM), and in situ confocal laser scanning microscopy (CLSM). In most cases, the active sites were found to be associated with particles (inclusions) which contained mainly Al and Si; however, some other areas not associated with particles were also found to be active. Although the size of the inclusions was normally smaller than 10 μm, as revealed by SEM and AFM imaging, in some cases larger particles were also found. Pitting corrosion tests in bromide solution at potentials above 1.5 VSCE followed by EDX analysis inside the pits and in situ CLSM observation, confirmed that most of the localized attack started in the areas where particles had been located.

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10.1149/1.1838590