Crystallographic Texture and Microstructure of Electrogalvanized Layer in Acid Sulfate Solution

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© 1995 ECS - The Electrochemical Society
, , Citation Y. B. Yim et al 1995 J. Electrochem. Soc. 142 2604 DOI 10.1149/1.2050061

1945-7111/142/8/2604

Abstract

The crystallographic texture and microstructure of electrogalvanized Zn layers on a mild steel cathode were studied with reference to the galvanizing variables including current density and chloride addition. Increasing the current density reduced the relative density of Zn basal planes parallel to the cathode surface. This phenomenon was attributed to the outgrowth of nonbasal planes within an ion‐depleted zone close to the metal substrate surface under high cathode overvoltage induced by the high current density. Chloride addition also affected the cathode overvoltage and subsequently the texture of the Zn layer. The effect depended on chloride concentration and temperature. Increasing the current density or adding chloride enhanced the hardness of the electrodeposited layer, as a result of grain size refinement and solid solution hardening.

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