Abstract
films have been prepared in the entire composition range from
to 
by using a chemical solution growth technique. Optimum conditions to deposit good quality films have been determined. Structural and optical properties of the films have been studied. Electron diffraction analysis shows that the films have predominantly cubic (sphalerite) structure. The lattice parameter varies continuously from 5.81Å for 
to 6.06Å for 
films. The films have a direct bandgap, which varies continuously from 2.44 eV for 
to 1.74 eV for 
films.