Solid Solubility and Diffusion Coefficients of Boron in Silicon

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© 1969 ECS - The Electrochemical Society
, , Citation G. L. Vick and K. M. Whittle 1969 J. Electrochem. Soc. 116 1142 DOI 10.1149/1.2412239

1945-7111/116/8/1142

Abstract

The solid solubility and diffusion coefficients of boron in silicon have been determined as a function of temperature over the range of 700°–1151°C, by anodically sectioning diffused layers. The solid solubility was found to vary from at 700°C to at 1151°C. The diffusion coefficients for impurity levels below 1018 atoms/cm3 may be represented by . The diffusion coefficients above 1018 atoms/cm3 were found to be dependent on the impurity level.

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