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Double-Gate Junctionless Transistor for Analog Applications

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In this paper, analog performance of short channel symmetric double-gate junctionless transistor (DGJLT) is reported for the first time. The analog performance parameters, namely drain current (ID ), transconductance (Gm ), transconductance/drain current ratio (Gm /ID ), early voltage (VEA ), drain output conductance (GD ), output resistance (RO ), intrinsic gain (Gm RO ), gate to source capacitance (CGS ), gate to drain capacitance (CGD ) and unity gain cut-off frequency (fT ) for the n-type DGJLT are systematically investigated with the help of extensive device simulations and are compared with conventional inversion mode symmetric double-gate transistor (DGMOS) of similar dimensions. DGJLT offers superior transconductance/drain current ratio and intrinsic gain in the subthreshold region than its inversion mode counterpart having same dimensions. However, DGMOS presents higher unity gain cut-off frequency which makes it suitable for high speed applications as compared to a DGJLT transistor.

Document Type: Research Article

Publication date: 01 March 2013

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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