Optical Characterizations of CdS Thin Films Grown by Pulsed Laser Deposition Technique
Cadmium Sulphide (CdS) thin films were prepared by pulsed laser deposition technique under high vacuum. The structural characteristics were investigated by X-ray diffraction. The X-ray analysis revealed that the deposited CdS films are crystalline and have preferred orientation on a
plane (110) of an hexagonal system. Optical constants (n and k) were estimated using spectrophotometric measurements of transmittance and reflectance at normal incidence of light. The optical band gap energy was found to be 2.44 eV with direct allowed transitions. Some dispersion
parameters are calculated namely; single oscillator energy, dispersion energy, lattice dielectric constant and high frequency dielectric constant.
Keywords: CDS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; STRUCTURE CHARACTERIZATION
Document Type: Research Article
Publication date: 01 October 2014
- Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
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