H. O. Marcy, L. F. Warren, M. S. Webb, C. A. Ebbers, S. P. Velsko, G. C. Kennedy, and G. C. Catella, "Second-harmonic generation in zinc tris(thiourea) sulfate," Appl. Opt. 31, 5051-5060 (1992)
The linear and second-order nonlinear optical properties of single-crystal zinc tris(thiourea) sulfate, or ZTS, are determined. The deduced nonlinear coefficients are |d31| = 0.31, |d32| = 0.35, and |d33| = 0.23 pm/V compared with a |d14| value of 0.39 pm/V for potassium dihydrogen phosphate. Because it exhibits a low angular sensitivity (δΔk/δθ), ZTS may prove useful for type-II second-harmonic generation from 1.06 to 1.027 μm. We present the phase-matching measurement data for ZTS and compare the calculated frequency conversion efficiency for ZTS with that of several other well-characterized materials.
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Assignment of the laboratory reference frame relative to the crystallographic axes following the IEEE standard on piezoelectricity [An American National Standard: IEEE Standard on Piezoelectricity (Institute of Electrical and Electronics Engineers, New York, 1988)].
Calculated from Sellmeier data in Table 2; the angular sensitivity in parentheses is the measured value.
Table 8
Magnitudes of the dij Coefficients Calculated for ZTS with Data In Table 7
Coefficient
Magnitude (pm/V)
d32
0.35
d15
0.31
Table 9
ZTS Phase-Matching Loci Data Calculated by Using |d31| and |d32| Coefficientsa
Process and Label
θcalc (deg)
θmeas (deg)
ϕcalc (deg)
ϕmeas (deg)
|deff|
Ratio of Measured to Calculated |deff|
Calc. (pm/V)
Meas. (pm/V)
2ω I-A
90.0
90.0
48.7
49.5
0.231
0.227
0.98
2ω I-B
52.3
55.7
23.3
27.1
0.209
0.208
1.0
2ω I-O
67.8
69.8
42.5
43.8
0
***
***
2ω I-O
47.9
49.5
0.00
0.00
0
***
***
2ω II-A
14.5
17.6
0.00
0.00
0.313
0.299
0.96
2ω II-B
66.1
65.0
90.0
90.0
0.126
0.131
1.0
These coefficients were calculated from plate and sphere measurements made at the Lawrence Livermore National Laboratory and |d33| measured in Ref 13. The angle coordinates were calculated from Sellmeier data in Table 3.
Table 10
Type-II 1.064-μm SHG Parameters for Several Well-Characterized Materials at Optimum Angle Coordinatesa
The superscripts indicate the reference for either the parameter of interest or the source of the data used to calculate the parameter of interest.
The deff value given for Urea in Ref. 36 was scaled to d36(KDP) = 0.39 pm/V.
Table 11
Maximum Efficiency for Type-II Doubling of a 5-MW Diffraction-Limited 1.064-μm Laser Pulse, and Length of Optimized Crystal for a Fluence of 10 J/cm2
Crystal
Efficiency (%)
Length (cm)
BBO
54
0.72
LBO
92
2.7
KTP
96
1.07
KD*P
36
2.8
ZTS
73
14.6
Tables (11)
Table 1
Index-of-Refraction Data for ZTS
λ (μm)
nα
nβ
nγ
0.420
1.6907
1.7613
1.7684
0.430
1.6870
1.7570
1.7639
0.440
1.6834
1.7535
1.7606
0.450
1.6805
1.7499
1.7565
0.475
1.6736
1.7417
1.7489
0.490
1.6699
1.7383
1.7444
0.500
1.6682
1.7359
1.7422
0.500
1.6681
1.7354
1.7427
0.500
1.6684
1.7359
1.7420
0.500
1.6685
1.7359
1.7420
0.510
1.6665
1.7335
1.7403
0.520
1.6647
1.7313
1.7381
0.540
1.6611
1.7277
1.7343
0.570
1.6569
1.7228
1.7294
0.600
1.6538
1.7192
1.7258
0.650
1.6491
1.7136
1.7190
0.700
1.6455
1.7089
1.7154
0.730
1.6435
1.7067
1.7132
0.730
1.6435
1.7070
1.7132
0.730
1.6436
1.7067
1.7132
0.800
1.6391
1.7025
1.7085
0.900
1.6359
1.6983
1.7041
1.000
1.6328
1.6944
1.7007
1.064
1.6306
1.6936
1.6984
1.100
1.6301
1.6926
1.6972
1.200
1.6277
1.6902
1.6942
Table 2
Labels Used to Denote the Principal Dielectric and Crystallographic Axes in ZTS
Assignment of the laboratory reference frame relative to the crystallographic axes following the IEEE standard on piezoelectricity [An American National Standard: IEEE Standard on Piezoelectricity (Institute of Electrical and Electronics Engineers, New York, 1988)].
Calculated from Sellmeier data in Table 2; the angular sensitivity in parentheses is the measured value.
Table 8
Magnitudes of the dij Coefficients Calculated for ZTS with Data In Table 7
Coefficient
Magnitude (pm/V)
d32
0.35
d15
0.31
Table 9
ZTS Phase-Matching Loci Data Calculated by Using |d31| and |d32| Coefficientsa
Process and Label
θcalc (deg)
θmeas (deg)
ϕcalc (deg)
ϕmeas (deg)
|deff|
Ratio of Measured to Calculated |deff|
Calc. (pm/V)
Meas. (pm/V)
2ω I-A
90.0
90.0
48.7
49.5
0.231
0.227
0.98
2ω I-B
52.3
55.7
23.3
27.1
0.209
0.208
1.0
2ω I-O
67.8
69.8
42.5
43.8
0
***
***
2ω I-O
47.9
49.5
0.00
0.00
0
***
***
2ω II-A
14.5
17.6
0.00
0.00
0.313
0.299
0.96
2ω II-B
66.1
65.0
90.0
90.0
0.126
0.131
1.0
These coefficients were calculated from plate and sphere measurements made at the Lawrence Livermore National Laboratory and |d33| measured in Ref 13. The angle coordinates were calculated from Sellmeier data in Table 3.
Table 10
Type-II 1.064-μm SHG Parameters for Several Well-Characterized Materials at Optimum Angle Coordinatesa
The superscripts indicate the reference for either the parameter of interest or the source of the data used to calculate the parameter of interest.
The deff value given for Urea in Ref. 36 was scaled to d36(KDP) = 0.39 pm/V.
Table 11
Maximum Efficiency for Type-II Doubling of a 5-MW Diffraction-Limited 1.064-μm Laser Pulse, and Length of Optimized Crystal for a Fluence of 10 J/cm2