Abstract
The deposition of glass films on thin ceramic substrates is a novel method for investigation of the initial stages of liquid infiltration into the grain boundaries of these materials. By maintaining electron transparency at all stages of the experiment, the transmission electron microscope (TEM) can be used to characterize individual grain boundaries before and after penetration by a liquid. The method has been tested for the MgO and Al2O3 systems, which have extensively studied experimental counterparts in which the corresponding bulk materials are infiltrated by a siliceous liquid.
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Acknowledgments
This research has been supported by the U. S. Department of Energy under Grant No. DE-FG02-92ER45465. The authors would like to thank Dr. Thomas Shaw and Mr. Peter Duncombe for providing the alumina, magnesia, and anorthite glass used in this study. MPM is also affiliated with the Department of Materials Science and Engineering, Cornell University, Ithaca, NY. The TEM is part of the Center for Interfacial Engineering, an NSF Engineering Research Center.
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Mallamaci, M.P., Ramamurthy, S.A.R. & Carter, C.B. Liquid Infiltration of MgO and Al2O3 Thin Films. MRS Online Proceedings Library 318, 589–594 (1993). https://doi.org/10.1557/PROC-318-589
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DOI: https://doi.org/10.1557/PROC-318-589