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Aging of iron manganite negative temperature coefficient thermistors

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Abstract

“Aging,” defined as the drift of resistance with temperature after 1000 h, was investigated for iron manganite temperature coefficient thermistors. For these devices, aging is relatively large, about 10%. The cationic distributions before and after aging were determined by Mössbauer spectroscopy. These distributions explain all the x-ray diffraction and correlated electrical data. The origin of the aging observed on iron manganites thermistors has been identified. It is due to the migration of Fe3+ ions from tetrahedral to octahedral sites of the spinel structure in order to reach a structural equilibrium.

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Battault, T., Legros, R. & Rousset, A. Aging of iron manganite negative temperature coefficient thermistors. Journal of Materials Research 13, 1238–1242 (1998). https://doi.org/10.1557/JMR.1998.0176

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  • DOI: https://doi.org/10.1557/JMR.1998.0176

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