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On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

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Abstract

Measurements of x-ray diffraction (XRD) profiles have been performed on commercially pure Fe and Al powders, cryomilled Fe–3 wt.% Al powders, cold pressed (CP) pure Fe and Al, hot pressed (HP) and hot isostatically pressed (HIP) Fe–3 wt.% Al. Scherrer equation (SE), integral breadth analysis (IBA), and single-line approximation (SLA) methods have been employed to extract grain size and microstrain. The results demonstrate that, in the case of the cryomilled nanocrystalline Fe–3 wt.% Al powders, all these XRD techniques yielded reasonable, consistent grain size results. However, discrepancies were found in cold pressed (CP-Fe), hot pressed (HP-Fe–3 wt.% Al), and hot isostatically pressed (HIP-Fe–3 wt.% Al) samples. TEM imaging revealed the presence of a certain density of dislocations inside the grains in the HP-Fe–3 wt.% Al and HIP-Fe–3 wt.% Al, which is thought to be partly or fully responsible for the observed discrepancies.

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Authors and Affiliations

  1. Department of Chemical, Biochemical Engineering and Materials Science, University of California-Irvine, 92697-2575, Irvine, California, USA

    H. G. Jiang & E. J. Lavernia

  2. Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174, Stuttgart, Germany

    M. Rühle

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  1. H. G. Jiang
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  2. M. Rühle
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  3. E. J. Lavernia
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Jiang, H.G., Rühle, M. & Lavernia, E.J. On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials. Journal of Materials Research 14, 549–559 (1999). https://doi.org/10.1557/JMR.1999.0079

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  • DOI: https://doi.org/10.1557/JMR.1999.0079

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