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Microstructural analysis of high-pressure compressed C60

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Abstract

The structure and hardness of C60 bulk specimens compressed under 5.5 GPa at room temperature to 600 °C are investigated by high-resolution transmission electron microscopy, x-ray diffraction, and micro-Vickers hardness tests. A strong accumulation of the [110]tr orientation of high-pressure-treated C60 specimens was developed along the compression axis, and stacking faults and nano-sized deformation twins were introduced into the C60 specimens compressed at 450–600 °C. Curved lattice planes indicating a polymerization of C60 were observed by high resolution transmission electron microscopy (HRTEM). The polymerization of the high-pressure-compressed C60 is also supported by the computer simulation of HRTEM images.

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Authors and Affiliations

  1. Department of Materials Engineering, School of Engineering, University of Tokyo, 7-3-1 Hongo, 113-8656, Bunkyo-ku, Tokyo, Japan

    K. Miyazawa, H. Satsuki & M. Kuwabara

  2. NIRIM, Namiki 1–1, 305, Tsukuba, Japan

    M. Akaishi

Authors
  1. K. Miyazawa
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  2. H. Satsuki
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  3. M. Kuwabara
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  4. M. Akaishi
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Miyazawa, K., Satsuki, H., Kuwabara, M. et al. Microstructural analysis of high-pressure compressed C60. Journal of Materials Research 16, 1960–1966 (2001). https://doi.org/10.1557/JMR.2001.0268

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  • DOI: https://doi.org/10.1557/JMR.2001.0268

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