Abstract
Plastic zone evolution in Al–2 wt% Si metal films on silicon and sapphire substrates was studied using nanoindentation and atomic force microscopy (AFM). AFM was used to measure the extent of plastic pileup, which is a measure of the plastic zone radius in the film. It was found that the plastic zone size develops in a self-similar fashion with increasing indenter penetration when normalized by the contact radius, regardless of film hardness or underlying substrate properties. This behavior was used to develop a hardness model that uses the extent of the plastic zone radius to calculate a core region within the indenter contact that is subject to an elevated contact pressure. AFM measurements also indicated that as film thickness decreases, constraint imposed by the indenter and substrate traps the film thereby reducing the pileup volume.
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A.K. Bhattacharya and W.D. Nix, Int. J. Sol. Struct. 27, 1047 (1991).
D. Lebouvier, P. Gilormini, and E. Felder, Thin Solid Films 172, 227 (1989).
B. Joönsson and S. Hogmark, Thin Solid Films 114, 257 (1984).
P.M. Sargent, in Microindentation Techniques in Materials Science, ASTM Spec. Tech. Publ. 889, edited by P.J. Blau and B.R. Lawn (ASTM, Philadelphia, PA, 1986).
P.J. Burnett and T.F. Page, J. Mater. Sci. 19, 845 (1984).
P.J. Burnett and D.S. Rickerby, Thin Solid Films 148, 41 (1987).
P.J. Burnett and D.S. Rickerby, Thin Solid Films 148, 51 (1987).
B.D. Fabes, W.C. Oliver, R.A. McKee, and F.J. Walker, J. Mater. Res. 7, 3056 (1992).
J-H. Ahn and D. Kwon, J. Appl. Phys. 82, 3266 (1997).
D. Stone, W.R. LaFontaine, P. Alexopoulos, T-W. Wu, and C-Y. Li, J. Mater. Res. 3, 141 (1988).
A.K. Bhattacharya and W.D. Nix, Int. J. Sol. Struct. 24, 1287 (1988).
M. Wittling, A. Bendavid, P.J. Martin, and M.V. Swain, Thin Solid Films 270, 283 (1995).
R. Hill, The Mathematical Theory of Plasticity (Clarendon Press, Oxford, United Kingdom, 1950).
D.M. Marsh, Proc. R. Soc. London A 279, 420 (1964).
K.L. Johnson, J. Mech. Phys. Sol. 18, 115 (1970).
S.S. Chiang, D.B. Marshall, and A.G. Evans, J. Appl. Phys. 53, 298 (1982).
I.J. Ford, Thin Solid Films 245, 122 (1994).
F.E. Kennedy and F.F. Ling, J. Eng. Mater. Tech. 86, 97 (1974).
T.A. Laursen and J.C. Simo, J. Mater. Res. 7, 618 (1992).
A. Bolshakov and G.M. Pharr, J. Mater. Res. 13, 1049 (1998).
M.F. Doerner and W.D. Nix, J. Mater. Res. 1, 601 (1986).
W.C. Oliver and G.M. Pharr, J. Mater. Res. 7, 1564 (1992).
T.Y. Tsui and G.M. Pharr, J. Mater. Res. 14, 292 (1999).
C-J. Lu and D.B. Bogy, Int. J. Solids Struct. 32, 1759 (1995).
S. Harvey, H. Huang, S. Venkataraman, and W.W. Gerberich, J. Mater. Res. 8, 1291 (1993).
D. Kramer, H. Huang, M. Kriese, J. Robach, J. Nelson, A. Wright, D. Bahr, and W.W. Gerberich, Acta Mater. 47, 333 (1999).
W. Zielinski, H. Huang, and W.W. Gerberich, J. Mater. Res. 8, 1300 (1993).
W. Zielinski, H. Huang, S. Venkataraman, and W.W. Gerberich, Phil. Mag. A 72, 1221 (1995).
L.E. Samuels and T.O. Mulhearn, J. Mech. Phys. Solids 5, 125 (1957).
T.F. Page, W.C. Oliver, and C.J. McHargue, J. Mater. Res. 7, 450 (1992).
G.M. Pharr, W.C. Oliver, R.F. Cook, P.D. Kirchner, M.C. Kroll, T.R. Dinger, and D.R. Clarke, J. Mater. Res. 7, 961 (1992).
M.F. Doerner, D.S. Gardner, and W.D. Nix, J. Mater. Res. 1, 845 (1986).
R. Venkatraman and J.C. Bravman, J. Mater. Res. 7, 2040 (1992).
A.G. Dirks, P.E. Wierenga, and J.J. van den Broek, Thin Solid Films 172, 51 (1989).
B.R. Lawn, A.G. Evans, and D.B. Marshall, J. Am. Ceram. Soc. 63, 574 (1980).
M.I. Baskes (private communication, Los Alamos National Labo-ratories, 1999).
M.R. Castell, G. Shafirstein, and D.A. Ritchie, Philos. Mag. A 74, 1185 (1996).
J. Smit and H.P.J. Wijn, Ferrites (Philips Technical Library, Eind-hoven, The Netherlands, 1959).
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Kramer, D.E., Volinsky, A.A., Moody, N.R. et al. Substrate effects on indentation plastic zone development in thin soft films. Journal of Materials Research 16, 3150–3157 (2001). https://doi.org/10.1557/JMR.2001.0434
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DOI: https://doi.org/10.1557/JMR.2001.0434