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Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

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Abstract

Strontium-modified lead titanate thin films with composition Pb1−xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.

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Pontes, F.M., Leal, S.H., Pizani, P.S. et al. Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique. Journal of Materials Research 18, 659–663 (2003). https://doi.org/10.1557/JMR.2003.0087

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  • DOI: https://doi.org/10.1557/JMR.2003.0087

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