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Nanoscale impedance and complex properties in energy-related systems

  • Scanning probes for new energy materials: Probing local structure and function
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Abstract

Atomic force microscopy (AFM)-based impedance spectroscopy provides localized impedance information of materials and interfaces at the nanoscale by utilizing the conductive AFM tip as a moving electrode to detect current response as a function of time and frequency under controlled environments. This capability enables AFM-based nanoscale impedance measurements to play a unique role in enhancing our understanding of many electronic and electrochemical devices. This article introduces the central concepts of AFM-based impedance measurement and reviews recent examples applying this technique to a variety of functional materials systems, in particular focusing on fuel cells, lithium-ion batteries, photoactive biomembranes, as well as other application examples.

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Authors and Affiliations

  1. Nuclear Science and Engineering Department, Massachusetts Institute of Technology, USA

    Wonyoung Lee

  2. Mechanical Engineering and Materials Science and Engineering Departments, Stanford University, USA

    Fritz B. Prinz

  3. Materials Science and Engineering, University of Pennsylvania, USA

    Xi Chen, S. Nonnenmann & Dawn A. Bonnell

  4. Metallurgical and Materials Engineering, Colorado School of Mines, USA

    Ryan P. O’Hayre

Authors
  1. Wonyoung Lee
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  2. Fritz B. Prinz
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  3. Xi Chen
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  4. S. Nonnenmann
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  5. Dawn A. Bonnell
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  6. Ryan P. O’Hayre
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Correspondence to Wonyoung Lee.

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Lee, W., Prinz, F.B., Chen, X. et al. Nanoscale impedance and complex properties in energy-related systems. MRS Bulletin 37, 659–667 (2012). https://doi.org/10.1557/mrs.2012.145

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