doiSerbia

Novel single layer fault tolerance RCA construction for QCA technology

Taheri Zahra (ACECR Institute of Higher Education, Isfahan Branch, Isfahan, Iran)
Rezai Abdalhossein (ACECR Institute of Higher Education, Isfahan Branch, Isfahan, Iran)
Rashidi Hamid (ACECR Institute of Higher Education, Isfahan Branch, Isfahan, Iran)

Quantum-dot Cellular Automata (QCA) technology has become a promising and accessible candidate that can be used for digital circuits implementation at Nanoscale, but the circuit design in the QCA technology has been limited due to fabrication high-defect rate. So, this issue is an interesting research topic in the QCA circuits design. In this study, a novel 3-input Fault Tolerance (FT) Majority Gate (MG) is developed. Accordingly, an efficient 1-bit QCA full adder is developed using the developed 3-input MG. Then, a new 4-bit FT QCA Ripple Carry Adder (RCA) is developed based on the proposed 1-bit FT QCA FA. The developed circuits are implemented in the QCA Designer tool version 2.0.3. The results indicate that the developed QCA circuits provide advantages compared to other QCA circuits in terms of double and single cell missing defect, area and delay time.

Keywords: Nanoelectronics, fault-tolerance, majority gate, QCA FA, ripple carryadder, quantum-dot cellular automata