2010 Volume 51 Issue 11 Pages 2104-2108
An alternative to extract representative stress-strain curves from a set of indentation data measured with the Berkovich indenter is developed in this study. The “yield” depth in the representative strain is identified by a double logarithm plot of indentation data, and it enables the establishment of a representative stress-strain curve. Comprehensive analyses are demonstrated using the new method proposed to capture the yield strength and the strain hardening exponent for an aluminum single crystal.