2014 Volume 61 Issue S1 Pages S273-S279
The role of magnetic anisotropy and crystallographic texture in determining rf properties of ferrites, and their performance characteristics when integrated within high frequency devices, is explored. Both thin film epitaxial and bulk polycrystalline texture are discussed defining viable paths to realizing crystallographic texture required for device integration. Of the broad classes of ferrite, we focus much of our attention on the versatile hexaferrite materials systems.