A Portable 3D Vision Coordinate Measurement System Using a Light Pen

Article Preview

Abstract:

A portable three-dimensional vision coordinate measuring system is proposed in this paper. It consists of a light pen, a CCD camera and a laptop computer. The light pen is a hand-held probe with three point light sources using LEDs and a spherical touch stylus arranged in one line. The CCD camera takes the image of LEDs on the light pen and the 3D coordinates of measured point at the center of touch stylus are obtained by computing the positions of LEDs in the image when the probe contacts the object surface. The equations of the vision measurement system are derived by using perspective of three collinear points and spatial analytic geometry. The measuring device can be set up easily on an industrial site and the measurement is convenient. The object surface can be simple, complex, or hidden from the view of camera. The effectiveness of the mathematical model and validity of the measuring system are confirmed by experiments.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 295-296)

Pages:

331-336

Citation:

Online since:

October 2005

Export:

Price:

[1] J.A. Bosch: Coordinate Measuring Machines and Systems (Marcel Dekker Inc., New York, USA 1995).

Google Scholar

[2] G.X. Zhang: Three-Dimensional Measuring Machine (Tianjin University Press, China 1999).

Google Scholar

[3] M. Wu, X.J. Wang, Z. Wang, S.H. Ye and M. Luo: Proc. of SPIE on Vibration Measurements by Laser Techniques: Advances and Applications, Vol. 2868 (1996), p.458.

Google Scholar

[4] G.X. Zhang, X.H. Li, Y.B. Lin, et al.: Annals of the CIRP, Vol. 52 (2003), p.427.

Google Scholar

[5] R. Horaud, B. Conio and O. Leboulleux: Computer Vision, Graphics, and Image Processing, Vol. 47 (1989), p.33.

DOI: 10.1016/0734-189x(89)90052-2

Google Scholar

[6] P. Lovenitti, W. Thompson and M. Singh: Optical Engineering, Vol. 35 (1996), p.1496.

Google Scholar

[7] W.J. Wolfe, D. Mathis, C.W. Sklair and M. Magee: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 13 (1991), p.67.

DOI: 10.1109/34.67632

Google Scholar

[8] Z.J. Zhang, Q.C. Huang, W.G. Lin and R.S. Che: Proc. of SPIE on Automated Optical Inspection for Industry: Theory, Technology, and Applications II, Vol. 3558 (1998), p.168.

Google Scholar