Genration of Oxidation Induced Stacking Faults in CZ Silicon Wafers
p.1737
p.1737
Relation between Minute Lattice Strain and Anomalous Oxygen Precipitation in a Czochralski-Grown Silicon Crystal
p.1743
p.1743
Photoluminescence Due To Oxygen Precipitates Distinguished from the D Lines in Annealed Si
p.1749
p.1749
Lattice Defects in High Quality As-Grown CZ Silicon, Studied with Ligth Scattering and Preferential Etching Techniques
p.1755
p.1755
Microdefects in Nitrogen Doped FZ Silicon Revealed by Li+ Drifting
p.1761
p.1761
Influence of Al Doping on Deep Levels in MBE GaAs
p.1767
p.1767
Deep Donor - Acceptor Correlations in Low Temperature GaAs
p.1773
p.1773
Dislocation Reduction of GaAs and AIGaAs on Si Substrate for High Efficiency Solar Cell
p.1779
p.1779
Spatial Distribution of Microdefects around Dislocations in Si-Doped GaAs
p.1785
p.1785
Microdefects in Nitrogen Doped FZ Silicon Revealed by Li+ Drifting
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 196-201)
Pages:
1761-1766
Citation:
Online since:
November 1995
Keywords:
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