An EBSD Analysis of the Origins of Ridging in AISI 430 Steel Sheets
p.173
p.173
Statistical Errors of Texture Entities Based on EBSD Orientation Measurements
p.179
p.179
3-Dimensional Fabric Reconstruction from 2-Dimensional Orientation Images
p.185
p.185
Automated Twin Identification Technique for Use with Electron Backscatter Diffraction
p.191
p.191
Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera
p.197
p.197
The Effect of Grain Orientation on Micro Frictional of Medium Carbon Steel
p.203
p.203
Scalar Measures of Texture Heterogeneity
p.207
p.207
Optical Grain Size Measurements: What is Being Measured? Comparative Study of Optical and EBSD Grain Sizes Determination in 2D Al Foil
p.213
p.213
Unbiased Evaluation of Chord Length Distributions from Orientation Maps
p.219
p.219
Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera
Abstract:
An automatic crystallographic orientation indexing procedure is developed for transmission electron microscopes. The numerical identification is performed by mapping the spot diffraction patterns with pre-calculated templates. The diffraction patterns are acquired thanks to an external CCD camera that points to the fluorescent screen through the TEM window. Orientation maps with spatial resolution better than 10 nm were obtained with this low cost equipment.
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Info:
Periodical:
Materials Science Forum (Volumes 495-497)
Pages:
197-202
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Online since:
September 2005
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