Determination of Real Space Residual Stress Distributions σij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach

Ingwer A. Denks; Manuela Klaus; Christoph Genzel

doi:10.4028/www.scientific.net/MSF.524-525.37

Paper Titles

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth
p.13

Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
p.19

Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods
p.25

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach
p.31

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach
p.37

The Residual Stresses Generated by Deep Rolling and their Stability in Fatigue & Application to Deep-Rolled Crankshafts
p.45

Stability of Residual Stresses of Deep Rolled Sintered Iron at Quasistatic and Cyclic Loading
p.51

Residual Stress Stability in High Temperature Fatigued Mechanically Surface Treated Metallic Materials
p.57

Residual Stresses Induced by Cross-Rolling
p.63

HomeMaterials Science ForumMaterials Science Forum Vols. 524-525Determination of Real Space Residual Stress...

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach

Abstract:

The detection of near surface residual stress gradients in real space requires high depth resolution for any orientation of the diffraction vector with respect to the sample co-ordinate system. In order to meet this demand, the slits are no longer being fixed in the laboratory co-ordinate system as in strain scanning experiments but directly coupled with the sample. Hence, the gauge volume orientation within the sample remains constant and allows performing depth-resolved sin2ψ measurements in real space. The method’s accuracy is determined by the gauge volume definition, which is investigated in detail. Apart from the evaluation of the σ(τ) versus σ(z) relation, which is of fundamental interest in X-ray residual stress gradient analysis, the method will be shown to have a unique applicability in rather delicate sample geometries such as multilayer systems.