Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution

Christian Kübel; Dirk Niemeyer; Robert Cieslinski; Steve Rozeveld

doi:10.4028/www.scientific.net/MSF.638-642.2517

Paper Titles

Industrial Research and Development with Synchrotron Radiation
p.2493

Comparison of the Mechanical Properties of Hastelloy X Material after Welding by GTAW and Nd-YAG Laser
p.2499

Hierarchical 3D/4D Characterization on Deformation Behavior of Austenitic and Pearlitic Steels
p.2505

Investigation of Sintering Processes by Tomography
p.2511

Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution
p.2517

Three-Dimensional Visualization and Analysis of Grain Deformation by Means of Synchrotron Radiation
p.2523

Investigation of the Surface Characteristics for the Micro-Cutting Process with Finite Element Simulation
p.2531

Mathematical Modeling of Microstructure Evolution of V Steels during Hot Rolling of Seamless Tubes
p.2537

A Model of Discontinuous Dynamic Recrystallization and its Application for Nickel Alloys
p.2543

HomeMaterials Science ForumMaterials Science Forum Vols. 638-642Electron Tomography of Nanostructured Materials –...

Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution

Abstract:

Electron tomography has developed into a powerful technique to image the 3D structure of complex materials with nanometer resolution. Both, TEM and HAADF-STEM tomography exhibit tremendous possibilities to visualize nanostructured materials for a wide range of applications. Electron tomography is not only a qualitative tool to visualize nano¬structures, but recently electron tomographic results are also exploited to obtain quantitative measurements in 3D. We evaluated the reconstruction and segmentation process for a heterogeneous catalyst and, in particular, tried to assess the reliability and accuracy of the quantification process. Furthermore, a quantitative analysis of electron tomographic results was compared to macroscopic measurements.

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Periodical:

Materials Science Forum (Volumes 638-642)

Pages:

2517-2522

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.638-642.2517

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Online since:

January 2010

Authors:

Christian Kübel, Dirk Niemeyer, Robert Cieslinski, Steve Rozeveld

Keywords:

3D Quantification, Electron Tomography, Nanostructured Materials, STEM, TEM

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