Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope

Joaquim Portillo; Edgar F. Rauch; Stavros Nicolopoulos; Mauro Gemmi; Daniel Bultreys

doi:10.4028/www.scientific.net/MSF.644.1

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Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope
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HomeMaterials Science ForumMaterials Science Forum Vol. 644Precession Electron Diffraction Assisted...

Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope

Abstract:

Precession electron diffraction (PED) is a new promising technique for electron diffraction pattern collection under quasi-kinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique may be used in TEM instruments of voltages 100 to 400 kV and is an effective upgrade of the TEM instrument to a true electron diffractometer. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.

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Periodical:

Materials Science Forum (Volume 644)

Pages:

1-7

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.644.1

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Cite this paper

Online since:

March 2010

Authors:

Joaquim Portillo, Edgar F. Rauch, Stavros Nicolopoulos, Mauro Gemmi, Daniel Bultreys

Keywords:

Crystal Orientation Mapping, Electron Backscatter Diffraction (EBSD), Phase Mapping, Precession Electron Diffraction (PED), TEM

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Creative Commons CC BY 4.0

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