Local Investigation of the Electrical Properties of Grain Boundaries in Silicon
p.183
p.183
Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
p.189
p.189
Minority Charge Carrier Trapping at Grain Boundaries Provided with a High Barrier Schottky Contact
p.195
p.195
Electrical Transport in Polycrystalline Semiconductors
p.201
p.201
Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors
p.213
p.213
Effect of Local Inhomogeneities on the Electrical Properties of Polycrystalline Silicon
p.219
p.219
On Some Photoelectrical Interface Processes in Mixed Semiconductor Heterostructures with Photosynthetic Pigment
p.225
p.225
Polycrystalline Silicon-Silicon Carbide Emitters for Heterojunction Transistors
p.231
p.231
Investigation of the Defect Distribution in Polycrystalline Silicon
p.243
p.243
Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors
Abstract:
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Periodical:
Solid State Phenomena (Volumes 37-38)
Pages:
213-218
Citation:
Online since:
March 1994
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