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Über dieses Buch

Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

Inhaltsverzeichnis

Frontmatter

Chapter 1. Fundamental Noise Mechanisms

Without Abstract
Martin von Haartman, Mikael Östling

Chapter 2. Noise Characterization

Without Abstract
Martin von Haartman, Mikael Östling

Chapter 3. 1/F Noise in Mosfets

Origins and modeling
Without Abstract
Martin von Haartman, Mikael Östling

Chapter 4. 1/f Noise Performance of Advanced Cmos Devices

Without Abstract
Martin von Haartman, Mikael Östling

Chapter 5. Introduction to Noise in Rf/Analog Circuits

Without Abstract
Martin von Haartman, Mikael Östling

Backmatter

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