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Erschienen in:
1982 | OriginalPaper | Buchkapitel
Measurements of the Energy Distributions of Positive Secondary Ions in the Energy Range from 0 to About 500 eV
verfasst von : C. Pahlke, H. Düsterhöft, U. Müller-Jahreis
Erschienen in: Secondary Ion Mass Spectrometry SIMS III
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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In this paper energy distributions of singly charged ions of Bi, Sb, W, Th, Cu, Zn and Cd as well as ions of some of their oxides emitted from the pure elements are presented. The purity of the target materials was ranged from 99 % (W, Th) to 99.999 % (other elements) ; all the materials had a polycrystalline structure and were mechanically polished.