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2019 | OriginalPaper | Buchkapitel

32. Microscopy in Forensic Sciences

verfasst von : Benjamin J. Jones

Erschienen in: Springer Handbook of Microscopy

Verlag: Springer International Publishing

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Abstract

This chapter examines the use of electron microscopy, atomic force microscopy and other analytical techniques in forensic investigation and research. These tools can be used to enhance examination of human remains and trace evidence to improve understanding of cause of death, victim identification, or postmortem interval.

A police-designed scenario is used to highlight trace evidence such as glass, gunshot residue, and paint. The validity of forensic techniques is discussed, with reference to international standards, repeatability, and false convictions. Ballistic evidence is used to highlight the complexities in evidence interpretation, including manufacturing variability, environmental effects, and likelihood ratios.

The use of scanning electron microscopy (), atomic force microscopy (), and other techniques in the development of forensic research is showcased, with particular examples from the field of fingerprint analysis. Examples include improvements in the development of fingermarks from difficult surfaces, the interaction of evidence types, and added intelligence from the crime scene, such as forensic timeline or gender of perpetrator.

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Vorheriges Kapitel Atomic Force Microscopy in the Life Sciences

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Titel: Microscopy in Forensic Sciences
verfasst von: Benjamin J. Jones
Verlag: Springer International Publishing
Buch: Springer Handbook of Microscopy
Print ISBN: 978-3-030-00068-4

Electronic ISBN: 978-3-030-00069-1

Copyright-Jahr: 2019
DOI: https://doi.org/10.1007/978-3-030-00069-1_32

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