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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 7/2016

22.03.2016

Microstructure and magnetic properties of self-assembled FePd–SiN films

verfasst von: L. Ma, L. Zhou, T. Liu, S. Q. Zhao, L. Li, X. F. Wu, Y. L. Zhang, G. Cheng

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 7/2016

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Abstract

Self-assembled FePd–SiN nanocomposite films were fabricated successfully by direct current (dc) reactive magnetron sputtering and then followed by vacuum annealing. The effects of Si–N matrix and annealing temperature on the structure and magnetic properties were investigated. The as-deposited films show typical magnetically soft behavior with face-centered cubic (fcc) FePd phase, which transforms into the face centered tetragonal (fct) structure after thermal annealing at 600 °C. The grain size of FePd increased with the annealing temperature but decreased with increasing Si–N content. Increasing Si–N content forms SiN-rich amorphous phase distributed between the FePd nanograins, which inhibits the growth of the FePd particles. The fct-FePd films annealed at 700 °C exhibited moderate coercivity, up to 2330 Oe at room temperature. These FePd–SiN films have shown promise for high-density magnetic recording medium.
Vorheriger Artikel Investigation of physical properties of perovskite PZT thin films as a function of sol temperature
Nächster Artikel Enhanced formaldehyde gas sensing properties of La-doped SnO2 nanoparticles prepared by ball-milling solid chemical reaction method

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Metadaten
Titel
Microstructure and magnetic properties of self-assembled FePd–SiN films
verfasst von
L. Ma
L. Zhou
T. Liu
S. Q. Zhao
L. Li
X. F. Wu
Y. L. Zhang
G. Cheng
Publikationsdatum
22.03.2016
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 7/2016
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-4717-9

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