Modelling Performance Analysis in VLSI Testing Methodologies

In order to improve the quality of devices before they are delivered to customers, VLSI testing processes have been created to detect damaged devices using automated test equipment. To characterize a chip and identify manufacturing issues that must be resolved before full production, a variety of devices must be tested. This testing methodology for services includes a time-consuming and error-prone planning process. Through the use of a queuing strategy, the performance level of the process used in these testing approaches is investigated and examined. In order to utilize the concept of queuing, the process of VLSI testing procedures is transformed into a mathematical problem. The supplemental variable approach is then used to resolve this mathematical queuing problem. A simulation process is used to create performance measurements for this type of queuing system of VLSI testing techniques using the MATLAB and R tools. Results are as anticipated. A specific discussion of how to prevent or minimize disruptions so that the system can run effectively is included in the analysis section.