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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 14/2018

21.05.2018

Modulation of Sn concentration in ZnO nanorod array: intensification on the conductivity and humidity sensing properties

verfasst von: A. S. Ismail, M. H. Mamat, I. B. Shameem Banu, M. F. Malek, M. M. Yusoff, R. Mohamed, W. R. W. Ahmad, M. A. R. Abdullah, N. D. Md. Sin, A. B. Suriani, M. K. Ahmad, M. Rusop

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 14/2018

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Abstract

Tin (Sn)-doped zinc oxide (ZnO) nanorod arrays (TZO) were synthesized onto aluminum-doped ZnO-coated glass substrate via a facile sonicated sol–gel immersion method for humidity sensor applications. These nanorod arrays were grown at different Sn concentrations ranging from 0.6 to 3 at.%. X-ray diffraction patterns showed that the deposited TZO arrays exhibited a wurtzite structure. The stress/strain condition of the ZnO film metamorphosed from tensile strain/compressive stress to compressive strain/tensile stress when the Sn concentrations increased. Results indicated that 1 at.% Sn doping of TZO, which has the lowest tensile stress of 0.14 GPa, generated the highest conductivity of 1.31 S cm−1. In addition, 1 at.% Sn doping of TZO possessed superior sensitivity to a humidity of 3.36. These results revealed that the optimum performance of a humidity-sensing device can be obtained mainly by controlling the amount of extrinsic element in a ZnO film.
Vorheriger Artikel Nanorod films of bisbenzimidazo[2,1-a:2′,1′-a′]anthra[2,1,9-def:6,5,10-d′e′f′]diisoquinoline-10,21-dione7 (BI-diisoQ) for highly optoelectronic devices
Nächster Artikel Structure and electrochemical properties of acid-leached LiMn2 − xTixO4

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Metadaten
Titel
Modulation of Sn concentration in ZnO nanorod array: intensification on the conductivity and humidity sensing properties
verfasst von
A. S. Ismail
M. H. Mamat
I. B. Shameem Banu
M. F. Malek
M. M. Yusoff
R. Mohamed
W. R. W. Ahmad
M. A. R. Abdullah
N. D. Md. Sin
A. B. Suriani
M. K. Ahmad
M. Rusop
Publikationsdatum
21.05.2018
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 14/2018
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-9314-7

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