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2017 | OriginalPaper | Buchkapitel

Nanofocused X-Ray Beam to Reprogram Secure Circuits

verfasst von : Stéphanie Anceau, Pierre Bleuet, Jessy Clédière, Laurent Maingault, Jean-luc Rainard, Rémi Tucoulou

Erschienen in: Cryptographic Hardware and Embedded Systems – CHES 2017

Verlag: Springer International Publishing

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Abstract

Synchrotron-based X-ray nanobeams are investigated as a tool to perturb microcontroller circuits. An intense hard X-ray focused beam of a few tens of nanometers is used to target the flash, EEPROM and RAM memory of a circuit. The obtained results show that it is possible to corrupt a single transistor in a semi-permanent state. A simple heat treatment can remove the induced effect, thus making the corruption reversible. An attack on a code stored in flash demonstrates unambiguously that this new technique can be a threat to the security of integrated circuits.

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Vorheriges Kapitel Generalized Polynomial Decomposition for S-boxes with Application to Side-Channel Countermeasures

Nächstes Kapitel Novel Bypass Attack and BDD-based Tradeoff Analysis Against All Known Logic Locking Attacks

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Titel: Nanofocused X-Ray Beam to Reprogram Secure Circuits
verfasst von: Stéphanie Anceau
Pierre Bleuet
Jessy Clédière
Laurent Maingault
Jean-luc Rainard
Rémi Tucoulou
Verlag: Springer International Publishing
Buch: Cryptographic Hardware and Embedded Systems – CHES 2017
Print ISBN: 978-3-319-66786-7

Electronic ISBN: 978-3-319-66787-4

Copyright-Jahr: 2017
DOI: https://doi.org/10.1007/978-3-319-66787-4_9

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